WorldCat Identities

Mayer, James W. 1930-

Overview
Works: 93 works in 387 publications in 3 languages and 7,566 library holdings
Genres: History  Conference papers and proceedings  Handbooks and manuals  Academic theses 
Roles: Author, Editor, htt, Contributor, Honoree, Other, Thesis advisor
Publication Timeline
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Most widely held works by James W Mayer
The science of paintings by W. Stanley Taft( Book )

27 editions published between 2000 and 2013 in English and held by 1,057 WorldCat member libraries worldwide

Discusses the physics and materials science behind paintings: the pigments, binders, canvas, varnish and so forth, that go into making a painting appear the way it does. This book helps the amateur or connoisseur understand the uses and limits of materials used in paintings
Patterns of light : chasing the spectrum from Aristotle to LEDs by Steven Beeson( )

20 editions published between 2008 and 2011 in English and held by 759 WorldCat member libraries worldwide

"Light is all around us - even when we do not see it. Our eyes do not detect the higher energy and shorter-than-visible-wavelength ultraviolet radiation, yet we know it is there from the sunburn we receive in Arizona. We know that window glass can block ultraviolet rays so we do not get a burn while driving with the windows rolled up. Our eyes do not detect the low-energy, long-wavelength infrared (IR) radiation but we know it exists from discussions of war applications and televised images of guided weapons targets. We also know about radio waves from the little boxes that talk to us and x-rays from the dentist's office." "Patterns of Light: Chasing the Spectrum from Aristotle to LEDs, starts with the visible - the straight path of light - and it continues with chapters detailing reflection (mirrors, storefront windows) and refraction (eyeglasses, binoculars). Color is then introduced with the query "Why is the sky blue?" After answering that and other similar questions ("Why is snow white?"), the book goes beyond the visible to the infrared and ultraviolet. Patterns of Light's many colorful photos and figures further aid in the reader's grasp of the concepts discussed." "Patterns of Light is a descriptive, rather than technical, book with the mathematics behind light included in the appendices. The book is designed for physics students of optics and engineering, but will certainly be enjoyed by all readers interested in gaining a broader perspective on light and its history."--BOOK JACKET
Silver metallization : stability and reliability by Daniel Adams( )

21 editions published between 2007 and 2008 in English and held by 553 WorldCat member libraries worldwide

"Silver has the lowest resistivity of all metals, which makes it an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the thermal and electrical stability, as well as processing issues which, to date, have prevented the implementation of silver as an interconnect metal. Silver Metallization: Stability and Reliability is the first book to discuss current knowledge of silver metallization and its potential as a favorable candidate for implementation as a future interconnect material for integrated circuit technology." "Silver Metallization: Stability and Reliability provides detailed information on a wide range of experimental, characterization and analysis techniques. It also presents the novel approaches used to overcome the thermal and electrical stability issues associated with silver metallization."--Jacket
Ion implantation and synthesis of materials by Michael Anthony Nastasi( )

25 editions published between 2006 and 2011 in English and held by 529 WorldCat member libraries worldwide

Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and circuits are seldom processed with less than 10 implantation steps. Controlled doping at controlled depths is an essential feature of implantation. Ion beam processing can also be used to improve corrosion resistance, to harden surfaces, to reduce wear and, in general, to improve materials properties. This book presents the physics and materials science of ion implantation and ion beam modification of materials. It covers ion-solid interactions used to predict ion ranges, ion straggling and lattice disorder. Also treated are shallow-junction formation and slicing silicon with hydrogen ion beams. Topics important for materials modification, such as ion-beam mixing, stresses, and sputtering, are also described
Fundamentals of surface and thin film analysis by Leonard C Feldman( Book )

17 editions published between 1986 and 2002 in English and held by 529 WorldCat member libraries worldwide

Ion implantation in semiconductors, silicon and germanium by James W Mayer( Book )

15 editions published between 1970 and 1983 in English and Undetermined and held by 446 WorldCat member libraries worldwide

Backscattering spectrometry by Wei-Kan Chu( Book )

16 editions published between 1978 and 2019 in English and held by 422 WorldCat member libraries worldwide

Backscattering Spectrometry reviews developments in backscattering spectrometry and covers topics ranging from instrumentation and experimental techniques to beam parameters and energy loss measurements. Backscattering spectrometry of thin films is also considered, and examples of backscattering analysis are given. This book is comprised of 10 chapters and begins with an introduction to backscattering spectrometry, what it can and what it cannot accomplish, and some """"rules of thumb"""" for interpreting or reading spectra. The relative strengths and weaknesses of backscattering spectrome
Fundamentals of nanoscale film analysis by Terry L Alford( )

1 edition published in 2007 in English and held by 411 WorldCat member libraries worldwide

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of Nanoscale Film Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons. The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions. Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail
Ion beam handbook for material analysis by James W Mayer( Book )

20 editions published between 1977 and 2014 in English and held by 375 WorldCat member libraries worldwide

Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering
Thin films : interdiffusion and reactions( Book )

13 editions published between 1197 and 1978 in English and held by 361 WorldCat member libraries worldwide

Materials analysis by ion channeling : submicron crystallography by Leonard C Feldman( Book )

15 editions published between 1982 and 2014 in English and held by 354 WorldCat member libraries worldwide

Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts
Ion-solid interactions : fundamentals and applications by Michael Anthony Nastasi( Book )

23 editions published between 1996 and 2004 in English and French and held by 322 WorldCat member libraries worldwide

Ion-solid interactions are the foundation that underlies the broad application of ion beams to the modification of materials. This text is designed to cover the fundamentals and applications of ion-solid interactions and is aimed at graduate students and researchers interested in electronic devices, surface engineering, reactor and nuclear engineering, and materials science issues associated with metastable phase synthesis
Laser annealing of semiconductors by J. M Poate( Book )

13 editions published in 1982 in English and held by 320 WorldCat member libraries worldwide

Laser Annealing of Semiconductors
Electronic materials science : for integrated circuits in Si and GaAs by James W Mayer( Book )

13 editions published between 1988 and 1990 in English and Undetermined and held by 239 WorldCat member libraries worldwide

Fundamentals of nanoscale film analysis by Terry L Alford( Book )

19 editions published between 2006 and 2008 in English and held by 224 WorldCat member libraries worldwide

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. This book focuses on the fundamental physics underlying the techniques used to analyze the nature of surfaces and near-surfaces in the properties of materials
Electronic thin film science : for electrical engineers and materials scientists by K. N Tu( Book )

9 editions published between 1992 and 1996 in English and held by 214 WorldCat member libraries worldwide

Ion beam analysis : fundamentals and applications by Michael Anthony Nastasi( )

14 editions published between 2014 and 2019 in English and Undetermined and held by 178 WorldCat member libraries worldwide

Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induc
New uses of ion accelerators by Thomas A Cahill( )

4 editions published in 1975 in English and held by 70 WorldCat member libraries worldwide

The use of ion accelerators for purposes other than nuclear l physics research has expanded to the point where lother uses are now the most typical. The point has been reached where there are as many ion accelerators in industry, as in universities; and the bulk of new accelerator purchases appears to be for applied purƯ poses. We mention this as introduction to a tribute to an earlier book: IINew Uses of Low Energy Accelerators" (1968). The authors of tnis book were almost all nuclear physicists. This book adƯ dressed itself to new uses other than nuclear research. And in great part because of the widespread seminal influence of this book, many of the new uses discussed became mature fields of reƯ search with their own conferences and publications. We have attempted in this book to both update with topics not included in the first book, and to present in a more tutorial and detailed manner the topics discussed. This book is in many ways a joint book. All chapters were the result of considerable collaboration between the authors. We hope that, above all, we have written with clarity. We welcome comments and questions from any reader. James F. Ziegler IBM-Research v CONTENTS CHAPTER 1. Ion-Excited X-Ray Analysis of Environmental Samples Thomas A. Cahill I. Introduction ..."
Ion beam surface layer analysis; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation by Yorktown Heights, N.Y., 1973 International Conference on Ion beam Surface Layer Analysis( Book )

5 editions published in 1974 in English and held by 62 WorldCat member libraries worldwide

Nanoscale thin film analysis : fundamentals and techniques by Terry L Alford( Book )

2 editions published between 2006 and 2007 in English and held by 21 WorldCat member libraries worldwide

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Audience level: 0.54 (from 0.26 for The scienc ... to 0.72 for Fundamenta ...)

Patterns of light : chasing the spectrum from Aristotle to LEDs
Covers
Patterns of light : chasing the spectrum from Aristotle to LEDsSilver metallization : stability and reliabilityIon implantation and synthesis of materialsFundamentals of surface and thin film analysisIon implantation in semiconductors, silicon and germaniumFundamentals of nanoscale film analysisIon-solid interactions : fundamentals and applicationsElectronic materials science : for integrated circuits in Si and GaAs
Alternative Names
James W. Mayer physisch chemicus

Majer, D.

Mayer, J. W.

Mayer, J. W. 1930-

Mayer, J. W. 1930-2013

Mayer, J. W. (James W.), 1930-

Mayer, J. W. (James Walter), 1930-2013

Mayer, J. Walter 1930-2013

Mayer, James 1930-2013

Mayer, James W.

Mayer James Walter

Mayer, James Walter 1930-

Mayer, James Walter 1930-2013

Mayer, Jim 1930-2013

Mejer, Dž.

Mejer, Dž 1930-

Mejer, Dž 1930-2013

Майер Д.

Майер, Д 1930-

Майер, Д. (Джеймс В.), 1930-2013

Майер Джеймс

Мейер, Дж. (Джеймс В.), 1930-2013

メイヤー, J. W.

Languages
English (287)

French (2)

Chinese (1)