WorldCat Identities

Electrochemical Society Electronics Division

Overview
Works: 488 works in 884 publications in 1 language and 9,134 library holdings
Genres: Conference papers and proceedings 
Roles: Editor, 475, Other
Classifications: TK7871.85, 621.38152
Publication Timeline
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Most widely held works by Electrochemical Society
The surface chemistry of metals and semiconductors; a symposium sponsored by the Office of Naval Research and the Electrochemical Society, Columbus, Ohio, 1959 by Electrochemical Society( Book )

8 editions published between 1960 and 1972 in English and held by 288 WorldCat member libraries worldwide

Measurement techniques for thin films by Bertram Schwartz( Book )

5 editions published between 1967 and 1968 in English and held by 127 WorldCat member libraries worldwide

The Physics and chemistry of SiO₂ and the Si-SiO₂ interface 2( Book )

4 editions published in 1993 in English and held by 104 WorldCat member libraries worldwide

The first international symposium on the subject "The Physics and Chemistry of Si02 and the Si-Si02 Interface," organized in association with the Electrochemical Society, Inc., was held in Atlanta, Georgia on May 15- 20, 1988. This symposium contained sixty papers and was so successful that the sponsoring divisions decided to schedule it on a regular basis every four years. Thus, the second symposium on "The Physics and Chemistry of Si02 and the Si02 Interface was held May 18-21, 1992 in St. Louis, Missouri, again sponsored by the Electronics and Dielectrics Science and Technology Divisions of The Electrochemical Society. This volume contains manuscripts of most of the fifty nine papers presented at the 1992 symposium, and is divided into eight chapters - approximating the organization of the symposium. Each chapter is preceded with an introduction by the session organizers. It is appropriate to provide a general assessment of the current status and understanding of the physics and chemistry of Si02 and the Si02 interface before proceeding with a brief overview of the individual chapters. Semiconductor devices have continued to scale down in both horizontal and vertical dimensions. This has resulted in thinner gate and field oxides as well as much closer spacing of individual device features. As a result, surface condition, native oxide composition, and cleaning and impurity effects now provide a much more significant contribution to the properties of oxides and their interfaces
Proceedings of the Symposium on Silicon Nitride Thin Insulating Films by Symposium on Silicon Nitride Thin Insulating Films( Book )

7 editions published between 1983 and 1989 in English and held by 98 WorldCat member libraries worldwide

Proceedings of the International Symposium on Solar Energy by International Symposium on Solar Energy( Book )

3 editions published between 1976 and 1981 in English and held by 89 WorldCat member libraries worldwide

Semiconductor silicon by International Symposium on Silicon Materials Science and Technology( )

in English and held by 87 WorldCat member libraries worldwide

Proceedings of the Symposium on Dielectric Films on Compound Semiconductors by Symposium on Dielectric Films on Compound Semiconductors( Book )

5 editions published between 1986 and 1988 in English and held by 81 WorldCat member libraries worldwide

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices by Symposium on Diagnostic Techniques for Semiconductor Materials and Devices( Book )

2 editions published in 1997 in English and held by 77 WorldCat member libraries worldwide

Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices by 1991, Phoenix, Ariz.> Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. <2( Book )

3 editions published between 1988 and 1994 in English and held by 74 WorldCat member libraries worldwide

VLSI science and technology/1982 : proceedings of the First International Symposium on Very Large Scale Integration Science and Technology by International Symposium on Very Large Scale Integration Science and Technology( Book )

3 editions published in 1982 in English and held by 73 WorldCat member libraries worldwide

Properties of electrodeposits, their measurement and significance by Richard Sard( Book )

3 editions published between 1975 and 1986 in English and held by 73 WorldCat member libraries worldwide

Proceedings of the Symposium on Thin Film Interfaces and Interactions by Symposium on Thin Film Interfaces and Interactions( Book )

2 editions published in 1980 in English and held by 72 WorldCat member libraries worldwide

Plasma processing : proceedings of the third Symposium on Plasma Processing by Symposium on Plasma Processing( Book )

4 editions published between 1982 and 1998 in English and held by 71 WorldCat member libraries worldwide

High purity silicon VI : proceedings of the Sixth International Symposium by International Symposium on High Purity Silicon( Book )

2 editions published in 2000 in English and held by 68 WorldCat member libraries worldwide

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices by Topical Conference on Characterization Techniques for Semiconductor Materials and Devices( Book )

3 editions published in 1978 in English and held by 65 WorldCat member libraries worldwide

Proceedings of the Symposium on Laser and Electron Beam Processing of Electronic Materials by Symposium on Laser and Electron Beam Processing of Electronic Materials( Book )

1 edition published in 1980 in English and held by 65 WorldCat member libraries worldwide

Proceedings on the Symposium on Electron and Ion Beam Science and Technology : ninth international conference by International Conference on Electron and Ion Beam Science and Technology( Book )

3 editions published between 1980 and 1983 in English and held by 65 WorldCat member libraries worldwide

Proceedings of the First International Symposium on Diamond and Diamond-Like Films by International Symposium on Diamond and Diamond-Like Films( Book )

1 edition published in 1989 in English and held by 64 WorldCat member libraries worldwide

 
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The Physics and chemistry of SiO₂ and the Si-SiO₂ interface 2
Languages
English (72)

Covers
Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and DevicesProceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices