WorldCat Identities

Fuchs, H. O. (Henry Otten) 1907-

Overview
Works: 58 works in 96 publications in 2 languages and 1,537 library holdings
Genres: Handbooks, manuals, etc  Case studies  Conference proceedings 
Roles: Author, Editor
Classifications: TA460, 620.163
Publication Timeline
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Most widely held works by H. O Fuchs
Metal fatigue in engineering by H. O Fuchs( Book )

13 editions published between 1980 and 2001 in English and held by 481 WorldCat member libraries worldwide

Annotation
10 cases in engineering design by H. O Fuchs( Book )

7 editions published in 1973 in English and held by 212 WorldCat member libraries worldwide

Proceedings of the Second International Conference on Shot Peening : ICSP-2, Chicago, Illinois, 14-17 May 1984 by International Conference on Shot Peening( Book )

4 editions published in 1984 in English and held by 32 WorldCat member libraries worldwide

Applied Scanning Probe Methods IV Industrial Applications by Bharat Bhushan( Book )

5 editions published between 2005 and 2011 in English and held by 25 WorldCat member libraries worldwide

Annotation
Über die Einflüsse von Schwingungsbremsen auf die Federung von Kraftwagen by Henry Otten Fuchs( Book )

3 editions published between 1932 and 1933 in German and held by 10 WorldCat member libraries worldwide

Applied scanning probe methods II : scanning probe microscopy techniques by Bharat Bhushan( Book )

4 editions published between 2006 and 2011 in English and held by 8 WorldCat member libraries worldwide

Annotation
Applied scanning probe methods III : characterization by Bharat Bhushan( Book )

5 editions published between 2005 and 2011 in English and held by 6 WorldCat member libraries worldwide

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes
Hoover Dam : a case history in engineering design by Peter Searls( Book )

1 edition published in 1964 in English and held by 6 WorldCat member libraries worldwide

Design and development of an automatic refrigerator car heater : a case history by H. O Fuchs( Book )

2 editions published in 1963 in English and held by 5 WorldCat member libraries worldwide

Trying to see the back of the moon : a case history in engineering design by H. O Fuchs( Book )

1 edition published in 1963 in English and held by 4 WorldCat member libraries worldwide

Engineering cases, 1972( Book )

1 edition published in 1972 in English and held by 3 WorldCat member libraries worldwide

Development of an oil well tubing stripper rubber : a case history in engineering design by Paul E Bickel( Book )

1 edition published in 1964 in English and held by 3 WorldCat member libraries worldwide

Dynasham Truck Company, Ltd. : truck suspension bolt and bushing failures by John A Alic( Book )

1 edition published in 1966 in English and held by 2 WorldCat member libraries worldwide

Beckman and Whitley, Inc. II : design of a mirror mount by David A Horine( Book )

1 edition published in 1966 in English and held by 2 WorldCat member libraries worldwide

Shortcuts in cumulative damage analysis by H. O Fuchs( Book )

2 editions published in 1973 in English and held by 2 WorldCat member libraries worldwide

Development of a dynamic seal at Beckman Instruments, Inc., Spinco Division by William J Clemens( Book )

1 edition published in 1967 in English and held by 2 WorldCat member libraries worldwide

Applied scanning probe methods( Book )

2 editions published in 2005 in English and held by 1 WorldCat member library worldwide

Design for manufacturability handbook by James G Bralla( )

in English and held by 0 WorldCat member libraries worldwide

From raw materials ... to machining and casting ... to assembly and finishing, the Second Edition of this classic guide will introduce you to the principles and procedures of Design for Manufacturability (DFM)Ñthe art of developing high-quality products for the lowest possible manufacturing cost. Written by over 70 experts in manufacturing and product design, this update features cutting-edge techniques for every stage of manufacturingÑplus entirely new chapters on DFM for Electronics, DFX (Designing for all desirable attributes), DFM for Low-Quality Production, and Concurrent Engineering
Applied scanning probe methods V : scanning probe microscopy techniques by Bharat Bhushan( )

1 edition published in 2007 in English and held by 0 WorldCat member libraries worldwide

Applied scanning probe methods( )

1 edition published in 2006 in English and held by 0 WorldCat member libraries worldwide

 
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Audience Level
0
Audience Level
1
  Kids General Special  
Audience level: 0.53 (from 0.20 for Dynasham T ... to 0.93 for Über die ...)

Alternative Names
Fuchs, H. O. 1907-

Fuchs, Henry Otten

Fuchs, Henry Otten 1907-

Languages
English (54)

German (3)

Covers
Applied Scanning Probe Methods IV Industrial ApplicationsApplied scanning probe methods II : scanning probe microscopy techniquesApplied scanning probe methods III : characterizationApplied scanning probe methodsApplied scanning probe methods V : scanning probe microscopy techniquesApplied scanning probe methods