WorldCat Identities

Institute of Electrical and Electronics Engineers Philadelphia Section

Overview
Works: 269 works in 541 publications in 1 language and 11,589 library holdings
Genres: Conference papers and proceedings  History  Periodicals 
Roles: Sponsor, Editor
Publication Timeline
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Most widely held works about Institute of Electrical and Electronics Engineers
 
Most widely held works by Institute of Electrical and Electronics Engineers
Proceedings : International Test Conference 1995 by International Test Conference( )

14 editions published between 1995 and 2002 in English and held by 828 WorldCat member libraries worldwide

Digest of technical papers by International Solid State Circuits Conference( )

in English and held by 496 WorldCat member libraries worldwide

This conference is the foremost global forum for presentation advancements in solid-state circuits. This proceeding is essential for the continuing education of engineered working at the leading edge of integrated circuit design and offers a unique opportunity to network with experts in these fields
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC by International Test Conference( )

7 editions published between 1988 and 2002 in English and held by 324 WorldCat member libraries worldwide

Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis, October 25-28, 1994, Philadelphia, Pennsylvania, USA by IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis( )

2 editions published in 1994 in English and held by 252 WorldCat member libraries worldwide

ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA by International Test Conference( )

5 editions published in 2001 in English and held by 243 WorldCat member libraries worldwide

Proceedings International Test Conference 2002 by 2002, Baltimore, Md.) International Test Conference (33( )

7 editions published in 2002 in English and held by 238 WorldCat member libraries worldwide

Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA by International Test Conference( )

5 editions published in 1993 in English and held by 236 WorldCat member libraries worldwide

Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA by International Test Conference( )

4 editions published in 1992 in English and held by 233 WorldCat member libraries worldwide

Proceedings of the ... IEEE VLSI Test Symposium : VTS by IEEE VLSI Test Symposium( )

in English and held by 226 WorldCat member libraries worldwide

International Test Conference 2009 : proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA by International Test Conference( )

2 editions published in 2009 in English and held by 223 WorldCat member libraries worldwide

38th IEEE Vehicular Technology Conference : 15-17 June, 1988, Philadelphia, Pa. : telecommunications freedom--technology on the move by IEEE Vehicular Technology Conference( )

3 editions published in 1988 in English and held by 220 WorldCat member libraries worldwide

1974 IEEE International Solid-State Circuits Conference : digest of technical papers by International Solid State Circuits Conference( )

4 editions published in 1974 in English and held by 217 WorldCat member libraries worldwide

1977 IEEE International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-State Circuits Conference( )

3 editions published in 1977 in English and held by 209 WorldCat member libraries worldwide

1975 IEEE International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-state Circuits Conference( )

3 editions published in 1975 in English and held by 208 WorldCat member libraries worldwide

Mikroelektronik, Chip, Halbleiterschaltung ; elektronischer Bauteil, Halbleiter
1967 International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-State Circuits Conference( )

5 editions published between 1967 and 1968 in English and held by 208 WorldCat member libraries worldwide

1971 IEEE International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-State Circuits Conference( )

3 editions published in 1971 in English and held by 207 WorldCat member libraries worldwide

1972 IEEE International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-State Circuits Conference( )

3 editions published in 1972 in English and held by 206 WorldCat member libraries worldwide

1973 IEEE International Solid-State Circuits Conference : digest of technical papers by International Solid State Circuits Conference( )

3 editions published in 1973 in English and held by 206 WorldCat member libraries worldwide

ITC International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA by International Test Conference( )

2 editions published in 2004 in English and held by 206 WorldCat member libraries worldwide

1970 IEEE International Solid-State Circuits Conference : digest of technical papers by IEEE International Solid-State Circuits Conference( )

4 editions published between 1969 and 1970 in English and held by 205 WorldCat member libraries worldwide

 
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Audience Level
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Audience Level
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Audience level: 0.55 (from 0.51 for Proceeding ... to 0.79 for 100 years ...)

Alternative Names
I.E.E.E. Philadelphia Section

IEEE Philadelphia Section

Philadelphia Section

Languages
English (104)