WorldCat Identities

Goldstein, Joseph 1939-

Overview
Works: 40 works in 233 publications in 4 languages and 4,744 library holdings
Genres: Laboratory manuals  Conference papers and proceedings 
Roles: Author, Editor, Other
Publication Timeline
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Most widely held works about Joseph Goldstein
 
Most widely held works by Joseph Goldstein
Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists by Joseph Goldstein( Book )

51 editions published between 1981 and 2014 in 3 languages and held by 1,300 WorldCat member libraries worldwide

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru­ ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail
Scanning electron microscopy and x-ray microanalysis by Joseph Goldstein( Book )

60 editions published between 1981 and 2018 in English and German and held by 730 WorldCat member libraries worldwide

Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--Page 4 of cover
Practical scanning electron microscopy : electron and ion microprobe analysis by Joseph Goldstein( Book )

25 editions published between 1975 and 1977 in English and Undetermined and held by 666 WorldCat member libraries worldwide

I Introduction.- I. Evolution of the Scanning Electron Microscope.- II. Evolution of the Electron Probe Microanalyzer.- III. Combination SEM-EPMA.- IV. Outline and Purpose of This Book.- References.- Bibliography of Texts and Monographs in SEM and EPMA.- II Electron Optics.- I. Electron Guns.- A. Tungsten Filament Cathode.- B. LaB6 Rod Cathode.- C. Field Emission Gun.- II. Electron Lenses.- A. General Properties of Magnetic Lenses.- B. Production of Minimum Spot Size.- C. Aberrations in the Electron Optical Column.- D. Design of the Final Lens.- III. Electron Probe Diameter dp vs. Electron Pro
Schreibersite growth and its influence on the metallography of coarse structured iron meteorites by Roy S Clarke( Book )

7 editions published in 1978 in English and held by 606 WorldCat member libraries worldwide

Introduction to analytical electron microscopy by John J Hren( Book )

10 editions published in 1979 in English and held by 469 WorldCat member libraries worldwide

Appendices, tables, summaries and acknowledgements are widely used after some chapters
Principles of analytical electron microscopy by David C Joy( Book )

14 editions published between 1986 and 2013 in English and held by 361 WorldCat member libraries worldwide

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J.J. Hren, J.I. Goldstein, and D.C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject
X-ray spectrometry in electron beam instruments by David B Williams( Book )

12 editions published between 1994 and 1995 in English and held by 218 WorldCat member libraries worldwide

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis
Phase transformations in ferrous alloys : proceedings of an international conference by Joseph Goldstein( Book )

6 editions published between 1984 and 2000 in English and held by 101 WorldCat member libraries worldwide

Applications of the analytical electron microscope to materials science by Joseph Goldstein( Book )

1 edition published in 1992 in English and held by 82 WorldCat member libraries worldwide

Shock and thermal history of iron and chondritic meteorites : final technical report, NASA NAG 9-45 by Joseph Goldstein( Book )

1 edition published in 1993 in English and held by 77 WorldCat member libraries worldwide

Scanning electron microscopy, X-ray microanalysis, and analytical electron microscopy : a laboratory workbook by Charles E Lyman( )

4 editions published in 1990 in English and held by 49 WorldCat member libraries worldwide

Scanning electron microscopy and x-ray microanalysis; Advanced sacanning electron microscopy; Advanced x-ray microanalysis; analytical electron microscopy; Guide to specimen preparation; Soluctions to laboratory exercises
Absorption tables for electron probe microanalysis by Isidore Adler( Book )

5 editions published in 1965 in English and held by 28 WorldCat member libraries worldwide

Scanning Electron Microscopy and X-ray Microanalysis : Third Edition by Joseph Goldstein( )

3 editions published in 2003 in English and held by 7 WorldCat member libraries worldwide

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping
Microbeam analysis, 1984 : proceedings of the 19th annual conference of the Microbeam Analysis Society, Bethlehem, Pennsylvania 16-20 July 1984 by Microbeam Analysis Society( Book )

3 editions published in 1984 in English and held by 6 WorldCat member libraries worldwide

The growth of the Widmanstatten pattern in metallic meteorites by Joseph Goldstein( )

3 editions published between 1964 and 1965 in English and held by 6 WorldCat member libraries worldwide

The effects of pressure, temperature and time on the formation of the Widmanstatten pattern found in metallic meteorites have been established. A means of analysis, using the method of finite differences, was developed for the study of the diffusion-controlled growth of the Widmanstatten pattern. The growth analysis accounted for (1) the change of D with Ni concentration; (2) the change of D and the Fe-Ni phase diagram with pressure; (3) the average meteorite composition; (4) the radius of the parent body and the pressure within it; (5) the degree of undercooling before precipitation took place; and (6) the distance between precipitates. The individual effect of each of these factors was determined and displayed in the form of parametric curves. Two cooling models with low internal pressure and two with high internal pressure were examined for the formation of the Widmanstatten pattern. These models were used to determine the temperature-time relationship in the growth analysis. Excellent agreement between the measured and the calculated taenite composition gradients was found for the low-pressure (<12 kb) models. The formation of plessite, the development of the two phase structures in ataxites, and the decrease in Ni concentration in the kamacite near the alpha/gamma boundary are all explained in terms of a low-pressure model. (Author)
Sao miao dian zi xian wei ji shu yu X she xian xian wei fen xi( Book )

2 editions published in 1988 in Chinese and held by 4 WorldCat member libraries worldwide

Ben shu jie shao le sao miao dian zi xian wei ji shu he dian zi tan zhen xian wei fen xi de yuan li, yi qi jie gou, shi yan fang fa, tu xiang yu hua xue cheng fen fen xi, yi ji zai gu ti he sheng wu cai liao zhong de ying yong
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologist, Materials Scientist, and Geologists by Joseph Goldstein( )

2 editions published between 1981 and 1992 in English and held by 3 WorldCat member libraries worldwide

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail
Beyond the best interests of the child by Joseph Goldstein( Book )

1 edition published in 1973 in English and held by 3 WorldCat member libraries worldwide

Before the best interests of the child by Joseph Goldstein( Book )

1 edition published in 1980 in English and held by 2 WorldCat member libraries worldwide

Op welke gronden moet de overheid ingrijpen in de relatie tussen ouders en kinderen en welke problemen spelen hierbij mee? Dit boek gaat over de relatie tussen ouders en kinderen. Wanneer de zorg van ouders voor kinderen niet goed verloopt komt de overheid in actie
Approximate cooling rate of the Widmanstatten structure in meteorites by James M Short( Book )

2 editions published in 1965 in English and held by 2 WorldCat member libraries worldwide

 
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Scanning electron microscopy and x-ray microanalysis
Covers
Scanning electron microscopy and x-ray microanalysisPrinciples of analytical electron microscopyX-ray spectrometry in electron beam instrumentsScanning electron microscopy, X-ray microanalysis, and analytical electron microscopy : a laboratory workbook
Alternative Names
Goldstein, J. 1939-

Goldstein, J. 1939-2015

Goldstein, J. I.

Goldstein, J. I. 1939-

Goldstein, J. I. 1939-2015

Goldstein, J. I. (Joseph I.), 1939-

Goldstein, J. (Joseph), 1939-

Goldstein, Joe 1939-

Goldstein, Joe 1939-2015

Goldstein, Joseph.

Goldstein Joseph I.

Goldstein, Joseph I. 1939-

Goldstein, Joseph I. 1939-2015

Gouldstejn, Dž.

Gouldstejn, Dž 1939-

Gouldstejn, Dž. 1939-2015

Joseph I. Goldstein American engineer

Joseph I. Goldstein Amerikaans ingenieur (1939-2015)

Гоулдстейн, Дж 1939-

Languages
English (209)

Chinese (2)

Spanish (1)

German (1)