WorldCat Identities

Rosenwaks, Yossi

Overview
Works: 16 works in 46 publications in 3 languages and 647 library holdings
Genres: Conference papers and proceedings  Academic theses 
Roles: Editor, Publishing director, Other, Author, htt, Thesis advisor
Classifications: TA417.23, 620.11
Publication Timeline
.
Most widely held works by Yossi Rosenwaks
Scanning probe microscopy : characterization, nanofabrication and device application of functional materials by Paula Maria Vilarinho( )

26 editions published in 2005 in English and held by 592 WorldCat member libraries worldwide

Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices
Interface Phenomena in Organic Electronics : September 16-20, 2013, Kyoto, Japan by Interface Phenomena in Organic Electronics (Symposium)( Book )

2 editions published in 2013 in English and held by 20 WorldCat member libraries worldwide

Scanning probe microscopy : characterization, nanofabrication and device application of functional materials( )

1 edition published in 2006 in English and held by 12 WorldCat member libraries worldwide

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology
EMRS 2002 Symposium E Advanced Characterization of Semiconductors : Strasbourg, June 2002 by European Materials Research Society( Book )

4 editions published in 2003 in English and held by 8 WorldCat member libraries worldwide

Ultrafast recombination processes at interfaces of II-VI and III-V compound semiconductors by Yossi Rosenwaks( Book )

2 editions published in 1991 in English and held by 3 WorldCat member libraries worldwide

Silicon devices for generation of sub-nanosecond pulsed power by Yaakov Sharabani( Book )

1 edition published in 2016 in English and held by 1 WorldCat member library worldwide

Electrostatically formed Si Nanowires and GaN/AlGaN based Transistors for Temperature and IR Radiation Sensing by Klimentiy Shimanovich( Book )

1 edition published in 2019 in English and held by 1 WorldCat member library worldwide

Special issue: EMRS 2002 Symposium E, Advanced Characterization of Semiconductors [June 18 - 21, 2002] by Symposium Advanced Characterization of Semiconductors( Book )

1 edition published in 2003 in English and held by 1 WorldCat member library worldwide

Electrostatically-formed nanowire based gas sensor by Alexander Henning( Book )

1 edition published in 2016 in English and held by 1 WorldCat member library worldwide

Nanoscale-Electronic Characterization of InAs Nanowires by Eliezer Halpern( Book )

1 edition published in 2014 in English and held by 1 WorldCat member library worldwide

Electrostatically-formed Nanowire as a Chemical Sensor by Nandhini Swaminathan( Book )

1 edition published in 2017 in English and held by 1 WorldCat member library worldwide

Advanced characterization of semiconductors( Book )

1 edition published in 2003 in English and held by 1 WorldCat member library worldwide

<>( Book )

1 edition published in 1987 in Hebrew and held by 1 WorldCat member library worldwide

Vospominanija ob Ilʹe Ilʹfe i Evgenii Petrove sbornik( Book )

1 edition published in 1963 in Russian and held by 1 WorldCat member library worldwide

Techniques to quantify local electric potentials and eliminate electrostatic artifacts in atomic force microscopy by Dominik Ziegler( Book )

1 edition published in 2009 in English and held by 0 WorldCat member libraries worldwide

 
moreShow More Titles
fewerShow Fewer Titles
Audience Level
0
Audience Level
1
  General Special  
Audience level: 0.31 (from 0.27 for Special is ... to 0.94 for Scanning p ...)

Scanning probe microscopy : characterization, nanofabrication and device application of functional materials Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002
Covers
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002
Alternative Names
Rosenwaks, Y.

Rosenwaks, Yossi

Languages