Larsen, Poul K.
Overview
Works: | 3 works in 4 publications in 2 languages and 14 library holdings |
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Genres: | Conference papers and proceedings |
Roles: | Author, Editor |
Publication Timeline
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Most widely held works by
Poul K Larsen
Energie, licht en beweging door dik en dun by
Poul K Larsen(
Book
)
2 editions published in 1997 in Dutch and held by 10 WorldCat member libraries worldwide
2 editions published in 1997 in Dutch and held by 10 WorldCat member libraries worldwide
Ferroelectric thin films III : symposium held April 13-16,1993, San Francisco, California, U.S.A. by Materials Research Society(
Book
)
1 edition published in 1993 in English and held by 3 WorldCat member libraries worldwide
1 edition published in 1993 in English and held by 3 WorldCat member libraries worldwide
Ferroelectric Thin Films III, Symposium Held in San Francisco, California on April 13-16, 1993. Materials Research Society
Symposium Proceedings, Volume 310(
)
1 edition published in 1993 in English and held by 1 WorldCat member library worldwide
This symposium showcased the advancement in processing technology and basic scientific understanding of ferroelectric thin films. The conference highlighted the use of novel materials science analysis techniques to characterize ferroelectric thin film materials and devices and to relate the nanoscale features and responses detected by these techniques to ferroelectric, electrooptic and piezoelectric properties. Examples of newer material analysis techniques included atomic force microscopy, electron spin resonance, high resolution transmission electron microscopy, combined Rutherford backscattering- nuclear reaction analysis and the use of optical interferometry to provide a three dimensional representation of field induced displacement
1 edition published in 1993 in English and held by 1 WorldCat member library worldwide
This symposium showcased the advancement in processing technology and basic scientific understanding of ferroelectric thin films. The conference highlighted the use of novel materials science analysis techniques to characterize ferroelectric thin film materials and devices and to relate the nanoscale features and responses detected by these techniques to ferroelectric, electrooptic and piezoelectric properties. Examples of newer material analysis techniques included atomic force microscopy, electron spin resonance, high resolution transmission electron microscopy, combined Rutherford backscattering- nuclear reaction analysis and the use of optical interferometry to provide a three dimensional representation of field induced displacement
Audience Level
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Associated Subjects