Front cover image for Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
eBook, English, 2009
Springer-Verlag US, Boston, MA, 2009